Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive
Reexamination Certificate
2011-04-26
2011-04-26
Caputo, Lisa M (Department: 2855)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Physical stress responsive
C073S754000
Reexamination Certificate
active
07932117
ABSTRACT:
A pressure sensor (e.g., a condenser microphone) includes a plate having a fixed electrode, a diaphragm having a moving electrode positioned opposite to the fixed electrode, and a support, wherein the diaphragm is subjected to displacement due to pressure variations applied thereto, and the support has a first interior wall forming a first cavity, in which the end portions of the plate are fixed, and a second interior wall, in which a step portion is formed in the thickness direction of the diaphragm in relation to the first interior wall and which forms a second cavity whose cross-sectional area is larger than the cross-sectional area of the first cavity in the plane direction of the diaphragm. The first and second cavities can be redesigned to communicate with each other via a passage, whereby it is possible to improve both of low-frequency characteristics and high-frequency characteristics in the pressure sensor.
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Caputo Lisa M
Pillsbury Winthrop Shaw & Pittman LLP
Roy Punam
Yamaha Corporation
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