Predictive methods and apparatus for non-volatile memory

Details Predictive methods and apparatus for non-volatile memory Predictive methods and apparatus for non-volatile memory

2005-04-29

2008-11-04

Maskulinski, Michael C (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

Reexamination Certificate

active

07447944

ABSTRACT:
A system and method (700) of indicating remaining life of a Non Volatile Memory (NVM) Array can be implemented in an integrated circuit. The method includes estimating (703) the remaining life of an NVM array by characterizing one or more cells to provide an estimate; comparing (709) the estimate to a threshold to provide a comparison; and when the estimate satisfies the threshold, providing (711) an indication corresponding to the comparison. The system comprises an NVM array (201); a controller (202) configured to control the NVM array, to estimate remaining life of the NVM array by characterizing one or more cells, and to provide an output signal corresponding to life expectancy of the NVM array; and a register (215) to store a flag corresponding to the output signal, where the flag may be used to provide information corresponding to predicted life expectancy to a user.

REFERENCES:
patent: 6601191 (2003-07-01), Norman et al.
patent: 6711705 (2004-03-01), Yasui
patent: 6714453 (2004-03-01), Cavaleri et al.
patent: 2002/0091965 (2002-07-01), Moshayedi
patent: 2003/0135793 (2003-07-01), Craig et al.
patent: WO 03/063176 (2003-07-01), None

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