Predicting timing degradations for data signals in an...

Details Predicting timing degradations for data signals in an... Predicting timing degradations for data signals in an...

2011-07-12

2011-07-12

Garbowski, Leigh Marie (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Integrated circuit design processing

Testing or evaluating

C716S108000, C716S113000, C716S117000

Reexamination Certificate

active

07979834

ABSTRACT:
A computer-implemented method of predicting timing characteristics within a semiconductor device can include determining configuration information for the semiconductor device and determining a measure of timing degradation for data signals of the semiconductor device according to the configuration information. The measure of timing degradation for the data signals can be output.

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U.S. Appl. No. 12/018,055, filed Jan. 22, 2008, Duong.

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