Predicting threshold and location of laser damage on optical sur

Details Predicting threshold and location of laser damage on optical sur Predicting threshold and location of laser damage on optical sur

1985-02-04

1987-05-19

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

Methods

250306, 2504921, G01N 23227

Patent

active

046671013

ABSTRACT:
An apparatus useful in the prediction of the damage threshold of various optical devices, the location of weak spots on such devices and the location, identification, and elimination of optical surface impurities comprising, a focused and pulsed laser, an photo electric detector/imaging means, and a timer. The weak spots emit photoelectrons when subjected to laser intensities that are less than the intensity actually required to produce the damage. The weak spots may be eliminated by sustained exposure to the laser beam.

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Wang et al., Laser Induced Damage in Optical Materials: 1974, pp. 59-65.
Van Stryland et al., Laser Induced Damage in Optical Materials: 1977, pp. 118-126.
Temple et al., Laser Induced Damage in Optical Materials: 1979, pp. 229-236.

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