Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2011-08-16
2011-08-16
Decady, Albert (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C714S030000, C257S048000, C382S141000, C382S149000, C382S151000, C382S154000
Reexamination Certificate
active
08000826
ABSTRACT:
One embodiment of the present invention provides a system that predicts manufacturing yield for a die within a semiconductor wafer. During operation, the system first receives a physical layout of the die. Next, the system partitions the die into an array of tiles. The system then computes systematic variations for a quality indicative value to describe a process parameter across the array of tiles based on the physical layout of the die. Next, the system applies a random variation for the quality indicative parameter to each tile in the array of tiles. Finally, the system obtains the manufacturing yield for the die based on both the systematic variations and the random variations.
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Chiang Charles C.
Luo Jianfeng
Sinha Subarnarekha
Su Qing
De'cady Albert
Park Vaughan Fleming & Dowler LLP
Stevens Thomas
Synopsys Inc.
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