Precursor compositions for ion implantation of antimony and ion

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

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438369, 438914, H01L 21338, H01L 21331

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059727438

ABSTRACT:
A method for n-doping a material layer with antimony, comprising ion implanting antimony from an antimony precursor composition including a compound of the formula SbX.sub.n ((CH.sub.2).sub.y SiR.sub.3).sub.n-3, wherein: n is an integer having a value of 1 or 2; y is an integer having a value of from 1 to 3 inclusive; each R is independently selected from C.sub.1 -C.sub.4 alkyl; and each X is independently selected from halo substituents. The antimony precursor composition may further include a fluorine-containing auxiliary gas, to effect in situ cleaning of the ionization chamber during ion implantation.

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"Advances in Ion Implanter Productivity and Safety" by Romig, et al., Solid State Technology, Dec. 1996, pp. 69-72.

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