Precision bypass clock for high speed testing of a data...

Details Precision bypass clock for high speed testing of a data... Precision bypass clock for high speed testing of a data...

2006-02-28

2006-02-28

Butler, Dennis M. (Department: 2115)

Electrical computers and digital processing systems: support

Clock, pulse, or timing signal generation or analysis

Multiple or variable intervals or frequencies

C713S600000

Reexamination Certificate

active

07007188

ABSTRACT:
A system clock circuit that provides a high-speed reference clock signal for operating an integrated circuit. The system clock circuit comprises a frequency combiner circuit that receives a first external clock signal having a frequency F1 and a second external clock signal having frequency F2, where F2 is an integer multiple of F1. The second external clock signal is phase-shifted by P degrees with respect to the first external clock signal. The frequency combiner circuit generates from the first and second external clock signals a first output clock signal having an operating frequency that is the sum of F1 and F2. The system clock circuit also comprises a clock selection circuit that selectively applies the first output clock signal to the integrated circuit.

REFERENCES:
patent: 5511100 (1996-04-01), Lundberg et al.
patent: 5583787 (1996-12-01), Underwood et al.
patent: 5600787 (1997-02-01), Underwood et al.
patent: 5714910 (1998-02-01), Skoczen et al.
patent: 5721514 (1998-02-01), Crockett et al.
patent: 6052811 (2000-04-01), Ahsuri
patent: 6385125 (2002-05-01), Ooishi et al.
patent: 6480045 (2002-11-01), Albean

Affiliated with

Also associated with

Rating

Precision bypass clock for high speed testing of a data... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Precision bypass clock for high speed testing of a data..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Precision bypass clock for high speed testing of a data... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3629183