Thermal measuring and testing – Thermal calibration system
Reexamination Certificate
2007-04-17
2007-04-17
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Thermal calibration system
C374S172000, C374S163000, C702S099000, C327S513000
Reexamination Certificate
active
11135064
ABSTRACT:
A temperature sensor with a plurality of temperature sense points based on a bandgap reference circuit providing negative temperature coefficient reference voltages and a positive temperature coefficient reference voltage. All negative temperature coefficient reference voltages have the same slope and the same spacing from each other. The intercept points between the negative temperature coefficient reference voltages and the positive temperature coefficient reference voltage determine the temperature sense points. Efficient calibration of the spacing of the temperature sense points is provided by a tap on a programmable resistor in the positive temperature coefficient reference circuit. Efficient calibration of the absolute temperature is provided by second programmable resistors in a circuit driven by two current sources. The calibration of one temperature point equally applies to all other second programmable resistors.
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Co-pending U.S. Patent ET-04-010, U.S. Appl. No. 11/056,796, filed Feb. 11, 2005, “Low Voltage Bandgap Reference (BGR) Circuit”, assigned to the same assignee.
Ackerman Stephen B.
Etron Technology Inc.
Saile Ackerman LLC
Verbitsky Gail
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