Power transistor free from back gate bias effect and an integrat

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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Details

257346, 257369, 257393, H01L 2910, H01L 2702, H01L 2906, H01L 2978

Patent

active

052508331

ABSTRACT:
A power transistor incorporated in an integrated circuit is fabricated on a lightly doped n-type well defined in a p-type semiconductor substrate, and comprises a lightly doped p-type region partially serving as a channel region, an heavily doped drain region formed in the lightly doped p-type region and contiguous to the channel region, and a source region formed in the lightly doped n-type well and spaced apart from the p-type region, a gate insulating film formed on the channel region, a gate electrode on the gate insulating film, and a heavily doped p-type ohmic contact region formed in the lightly doped p-type region for applying positive voltage to the lightly doped p-type region so that the power transistor is constructed as a double diffused MIS type field effect transistor, thereby controlling the back gate independent from the p-type semiconductor substrate.

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