Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package
Reexamination Certificate
2007-05-16
2009-10-27
Clark, Jasmine J (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
C257S703000, C257S705000, C257S706000, C257S707000, C257S712000, C257S713000, C257SE23090, C257SE23038, C257SE23101
Reexamination Certificate
active
07608917
ABSTRACT:
A power semiconductor module and an inverter apparatus in which a device or a joining part is not mechanically damaged even when the temperature in use becomes a high temperature in the range of 175 to 250° C., resulting in excellent reliability at high temperature retaining test and thermal cycling test. Low thermal expansion ceramic substrates are disposed above and below the device. A material having a coefficient of thermal expansion of 10 ppm/K or less is disposed between the ceramic substrates. In addition, an inorganic material having a coefficient of thermal expansion in the range of 2 to 6 ppm/K or less is disposed around the device.
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Ishii Toshiaki
Itou Kazutoshi
Kajiwara Ryoichi
Suzuki Kazuhiro
Antonelli, Terry Stout & Kraus, LLP.
Clark Jasmine J
Hitachi , Ltd.
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