Active solid-state devices (e.g. – transistors – solid-state diode – With means to increase breakdown voltage threshold – In integrated circuit
Reexamination Certificate
2006-04-20
2009-06-02
Dang, Trung (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
With means to increase breakdown voltage threshold
In integrated circuit
C257S493000, C257S495000
Reexamination Certificate
active
07541660
ABSTRACT:
A The semiconductor device has a heavily doped substrate and an upper layer with doped silicon of a first conductivity type disposed on the substrate, the upper layer having an upper surface and including an active region that comprises a well region of a second, opposite conductivity type. An edge termination zone has a junction termination extension (JTE) region of the second conductivity type, the region having portions extending away from the well region and a number of field limiting rings of the second conductivity type disposed at the upper surface in the junction termination extension region.
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Hille Frank
Raker Thomas
Schulze Hans-Joachim
Coats & Bennett P.L.L.C.
Dang Trung
Infineon Technologies Austria AG
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