Post and tip design for a probe contact

Electrolysis: processes – compositions used therein – and methods – Electrolytic coating – Coating selected area

Reexamination Certificate

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Details

C205S170000

Reexamination Certificate

active

07922888

ABSTRACT:
The present invention relates to A microfabricated tip and post structure comprising a post having a rough top surface that diffuses incident light and a cross-section, and a tip, lithographically plated on the rough top surface of the post, having a smooth reflective surface appropriate for automatic vision recognition, and having a cross-section that is less than the cross-section of the post.

REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 4161692 (1979-07-01), Tarzwell
patent: 4585991 (1986-04-01), Reid et al.
patent: 4719417 (1988-01-01), Evans
patent: 4899099 (1990-02-01), Mendenhall et al.
patent: 4906920 (1990-03-01), Huff et al.
patent: 5152695 (1992-10-01), Grabbe et al.
patent: 5177438 (1993-01-01), Littlebury et al.
patent: 5190637 (1993-03-01), Guckel
patent: 5191708 (1993-03-01), Kasukabe et al.
patent: 5321352 (1994-06-01), Takebuchi
patent: 5342737 (1994-08-01), Georger et al.
patent: 5475318 (1995-12-01), Marcus et al.
patent: 5513430 (1996-05-01), Yanof et al.
patent: 5613861 (1997-03-01), Smith et al.
patent: 5665648 (1997-09-01), Little
patent: 5776636 (1998-07-01), Kunisawa et al.
patent: 5811982 (1998-09-01), Beaman et al.
patent: 5828226 (1998-10-01), Higgins et al.
patent: 5914218 (1999-06-01), Smith et al.
patent: 5914614 (1999-06-01), Beamna et al.
patent: 5926951 (1999-07-01), Khandros et al.
patent: 5953306 (1999-09-01), Yi
patent: 5973394 (1999-10-01), Slocum et al.
patent: 5994152 (1999-11-01), Khandros et al.
patent: 6059982 (2000-05-01), Palagonia et al.
patent: 6232669 (2001-05-01), Khoury et al.
patent: 6245444 (2001-06-01), Marcus et al.
patent: 6255126 (2001-07-01), Mathieu et al.
patent: 6307392 (2001-10-01), Soejima et al.
patent: 6414501 (2002-07-01), Kim et al.
patent: 6426638 (2002-07-01), Di Stefano
patent: 6476908 (2002-11-01), Watson
patent: 6482013 (2002-11-01), Eldridge et al.
patent: 6520778 (2003-02-01), Eldridge et al.
patent: 6541187 (2003-04-01), Wang et al.
patent: 6616966 (2003-09-01), Mathieu et al.
patent: 6727579 (2004-04-01), Eldridge et al.
patent: 6736665 (2004-05-01), Zhou et al.
patent: 6771084 (2004-08-01), Di Stefano
patent: 6791176 (2004-09-01), Mathieu et al.
patent: 6799976 (2004-10-01), Mok et al.
patent: 6809539 (2004-10-01), Wada et al.
patent: 7180316 (2007-02-01), Ismail et al.
patent: 7245135 (2007-07-01), Ismai et al.
patent: 7264984 (2007-09-01), Garabedian et al.
patent: 7271022 (2007-09-01), Tang et al.
patent: 2003/0178547 (2003-09-01), Wang et al.
patent: 2006/0134819 (2006-06-01), Tang
patent: 2006/0134820 (2006-06-01), Tang
patent: 2007/0024298 (2007-02-01), Khoo
patent: 2007/0057685 (2007-03-01), Garabedian et al.
patent: 2007/0075717 (2007-04-01), Kinghorn et al.
patent: 2007/0145988 (2007-06-01), Garabedian et al.
patent: 2007/0182430 (2007-08-01), Ismal et al.
patent: 2007/0240306 (2007-10-01), Ismail et al.
patent: 0567332 (1993-10-01), None
patent: WO 2004/056698 (2004-07-01), None
Chris Bang and Nelsimar Vandellli, “Vertical Micro-probe Design Based on the EFABTMMicro-Fabrication Process, IEEE Southwest TEst Workshop 2003.”
Jun-Bo Yoon et al., “Monolithic Integration of 3-D Electroplated Microstructures With Unlimited Number of Levels Using Planarization With a Scarificial Metallic Mold (PSMM), pp. 624 thru 629.”
U.S. Appl. No. 11/983,521, Khoo et al.
U.S. Appl. No. 11/986,453, Garabedian et al.

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