Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2006-09-13
2009-11-03
Walke, Amanda C. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S905000, C430S913000, C430S311000
Reexamination Certificate
active
07611820
ABSTRACT:
A positive resist composition comprises:(A) a resin capable of increasing its solubility in an alkali developer by action of an acid and not containing a silicon atom;(B) a compound capable of generating an acid upon irradiation with actinic ray or radiation,(C) a silicon atom-containing resin having at least one group selected from groups (X) to (Z),(X) an alkali-soluble group,(Y) a group capable of decomposing by action of an alkali developer to increase the solubility of resin (C) in an alkali developer,(Z) a group capable of decomposing by action of an acid to increase the solubility of resin (C) in an alkali developer; and(D) a solvent.
REFERENCES:
patent: 6165682 (2000-12-01), Foster et al.
patent: 6210856 (2001-04-01), Lin et al.
patent: 6420084 (2002-07-01), Angelopoulos et al.
patent: 6994946 (2006-02-01), Hatakeyama et al.
patent: 7232638 (2007-06-01), Hatakeyama et al.
patent: 7294450 (2007-11-01), Tarutani
patent: 2002/0048720 (2002-04-01), Sasaki et al.
patent: 2002/0081520 (2002-06-01), Sooriyakumaran et al.
patent: 2002/0127490 (2002-09-01), Brock et al.
patent: 2005/0014090 (2005-01-01), Hirayama et al.
patent: 2005/0069819 (2005-03-01), Shiobara
patent: 2006/0246373 (2006-11-01), Wang
patent: 1 004 936 (2000-05-01), None
patent: 1004936 (2000-05-01), None
patent: 1500977 (2005-01-01), None
patent: 1517179 (2005-03-01), None
patent: 57-153433 (1982-09-01), None
patent: 7-220990 (1995-08-01), None
patent: 2001-51418 (2001-02-01), None
patent: 2004/040371 (2004-05-01), None
patent: WO 2004/068242 (2004-08-01), None
patent: WO 2004/077158 (2004-09-01), None
B.J. Lin, “Semiconductor Foundry, Lithography, and Partners”, SPIE Proceedings vol. 4688 2002.
J.A. Hoffnagle, et al., “Liquid Immersion Deep-Ultraviolet Interferometric Lithography”, J. Vac. Sci. Technol. B 17(6), Nov./Dec. 1999.
Database WPI XP-002416204. AN 2001-560170. Derwent Publications Ltd., London, GB; & JP 2001 051418 A (Canon KK), Feb. 23, 2001.
Inabe Haruki
Kanda Hiromi
Kanna Shinichi
FUJIFILM Corporation
Sughrue & Mion, PLLC
Walke Amanda C.
LandOfFree
Positive resist composition and pattern-forming method using... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Positive resist composition and pattern-forming method using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Positive resist composition and pattern-forming method using... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4111254