Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2007-03-13
2009-12-15
Chu, John S (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S326000, C430S330000, C430S905000, C430S910000
Reexamination Certificate
active
07632623
ABSTRACT:
A positive resist composition comprising: a resin which increases solubility in an alkali developing solution by an action of an acid and comprises a repeating unit containing a lactone structure and a cyano group, a repeating unit containing a first group selected from groups represented by the formulae (pI) to (pV) as defined herein and a repeating unit containing a second group selected from groups represented by the formulae (pI) to (pV) as defined herein which is different from the first group; a compound which generates an acid upon irradiation of an actinic ray or a radiation; and a solvent.
REFERENCES:
patent: 6207342 (2001-03-01), Takechi et al.
patent: 7371505 (2008-05-01), Kodama
patent: 2003/0224291 (2003-12-01), Hatakeyama et al.
patent: 2007/0148592 (2007-06-01), Wada et al.
patent: 2007/0190449 (2007-08-01), Momose et al.
patent: 1 457 822 (2004-09-01), None
patent: 1 580 598 (2005-09-01), None
patent: 1 621 927 (2006-02-01), None
patent: 1 764 652 (2007-03-01), None
patent: 11-119434 (1999-04-01), None
patent: 2005-008765 (2005-01-01), None
patent: 200523092 (2005-01-01), None
patent: WO 03/001294 (2003-01-01), None
Iwato Kaoru
Kodama Kunihiko
Yamamoto Kei
Yoshida Yuko
Chu John S
FUJIFILM Corporation
Sughrue & Mion, PLLC
LandOfFree
Positive resist composition and pattern formation method... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Positive resist composition and pattern formation method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Positive resist composition and pattern formation method... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4145807