Positive resist composition and pattern formation method...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S286100, C430S322000, C430S905000, C430S910000

Reexamination Certificate

active

10802808

ABSTRACT:
A positive resist composition comprising (A) a resin capable of increasing its solubility in an alkali developer under action of an acid, wherein the resin contains a repeating unit originated in an acrylic acid ester derivative in an amount of 50 to 100 mol % based on all repeating units and has a repeating unit having a specific lactone structure and a repeating unit having a monohydroxyadamantane or dihydroxyadamantane structure, (B) a compound of generating an acid upon irradiation with actinic rays or radiation, and (C) an organic solvent, and a pattern formation method using the composition.

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patent: 2001/0044070 (2001-11-01), Uetani et al.
patent: 2003/0017415 (2003-01-01), Kodama et al.
patent: 2003/0039918 (2003-02-01), Takata et al.
patent: 2003/0180659 (2003-09-01), Takata et al.
patent: 2004/0191676 (2004-09-01), Nakao et al.
patent: 10-254139 (1998-09-01), None
patent: 2001-142212 (2001-05-01), None
patent: 2002-229192 (2002-08-01), None

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