Positive resist composition and method of forming resist...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S326000, C430S330000, C430S905000, C430S910000

Reexamination Certificate

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07638257

ABSTRACT:
A positive resist composition that includes a resin component (A) and an acid generator component (B), wherein the component (A) includes a polymer compound (A1) having a structural unit (a0) represented by a general formula (a0) shown below, and a structural unit (a1), which is derived from an (α-lower alkyl) acrylate ester containing an acid-dissociable, dissolution-inhibiting group and is not classified as the structural unit (a0):(wherein, R represents a hydrogen atom or a lower alkyl group; Y1represents an aliphatic cyclic group; Z represents an alkoxyalkyl group; a represents an integer from 1 to 3, and b represents either 0 or an integer from 1 to 2, provided that a+b=1 to 3).

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International Search Report from PCT/JP2005/018382 dated Nov. 15, 2005.
Combined Office Action and Search Report issued on May 6, 2008, on the counterpart Taiwanese Patent Application No. 094134357.

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