Positive resist composition and method for resist pattern...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S326000, C430S910000

Reexamination Certificate

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07638258

ABSTRACT:
A positive resist composition includes a resin component (A) that exhibits increased alkali solubility under the action of acid, and an acid generator component (B) that generates acid upon exposure, wherein the resin component (A) is a mixture of a copolymer (A1) that includes a structural unit (a1) derived from an acrylate ester that contains an acid-dissociable, dissolution-inhibiting group, a structural unit (a2) derived from a methacrylate ester that contains a lactone-containing monocyclic group, and a structural unit (a3) derived from an acrylate ester that contains a polar group-containing polycyclic group, and a copolymer (A2) that has a different structure from the copolymer (A1) and has a lower hydrophilicity than the copolymer (A1).

REFERENCES:
patent: 6579659 (2003-06-01), Uetani et al.
patent: 7074543 (2006-07-01), Iwai et al.
patent: 2004/0058269 (2004-03-01), Hada et al.
patent: 2004/0137378 (2004-07-01), Sugeta et al.
patent: 2006/0099347 (2006-05-01), Sugeta et al.
patent: 2000-267269 (2000-09-01), None
patent: 2003-005374 (2003-01-01), None
patent: 2005-010488 (2005-01-01), None
International Search Report from PCT/JP2006/301127 dated Feb. 21, 2006.

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