Positive resist composition

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S905000, C430S910000

Reexamination Certificate

active

07105273

ABSTRACT:
A positive resist composition of the present invention achieving significant performance improvements in high energy-beam lithography, which comprises a phenolic polymer having a property of being insoluble or hardly soluble in an aqueous alkali solution and becoming soluble in an aqueous alkali solution by the action of an acid, in which the phenolic polymer includes a repeating unit containing at least one selected from the group consisting of an acetal-protected phenolic hydroxyl group, a ketal-protected phenolic hydroxyl group, a tertiary ester-protected carboxyl group and a tetrahydropyranyl-protected carboxyl group; and a compound having a phenacylsulfonium structure and capable of generating an acid upon irradiation with one of actinic rays and radiation.

REFERENCES:
patent: 6692884 (2004-02-01), Fujimori et al.
patent: 6733951 (2004-05-01), Kodama
patent: 2002/0182535 (2002-12-01), Maeda et al.
patent: 2003/0224288 (2003-12-01), Kodama
patent: 2005/0019689 (2005-01-01), Kodama
patent: 2005/0142484 (2005-06-01), Watanabe et al.
patent: 2-19847 (1990-01-01), None
patent: 4-211258 (1992-08-01), None
patent: 4-219757 (1992-08-01), None
patent: 2000-292917 (2000-10-01), None
patent: 2001-294570 (2001-10-01), None

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