Optics: measuring and testing – By alignment in lateral direction
Patent
1996-05-22
1998-12-01
Font, Frank G.
Optics: measuring and testing
By alignment in lateral direction
356400, G01B 1100
Patent
active
058446834
ABSTRACT:
The position sensor (20) and method of the present invention allows detecting proper placement of substrate holders (25) in a processing apparatus (35), and can also be used to detect displacement of the substrates (70) within the substrate holder (25). The position sensor (20) comprises (a) an optical emitter (120) capable of emitting a light beam, (b) an optical sensor (125) capable of sensing the light beam emitted by the optical emitter (120), and (c) a light regulator (130) in a path (135) of the light beam that is capable of blocking the light beam from the optical sensor when the substrate holder (25) is improperly positioned in the process chamber (40).
REFERENCES:
patent: 4657620 (1987-04-01), Davis et al.
patent: 4776744 (1988-10-01), Stonestreet et al.
patent: 5442163 (1995-08-01), Nakahara et al.
patent: 5483138 (1996-01-01), Shmookler et al.
patent: 5563798 (1996-10-01), Berken et al.
Pavloski Andrew
Rolny Andrej
Sklyar Dmitry
Applied Materials Inc.
Font Frank G.
Janah Ashok K.
Kwong Raymond K.
Stafira Michael P.
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