Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1981-12-22
1986-05-20
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 1, 356376, G01B 1100, G01B 1500
Patent
active
045897735
ABSTRACT:
A position detecting system suitable for the position control of the surface of a workpiece mounted in an electron beam exposure system is disclosed which includes an electrically-driven light source, a first optical system for focusing a light beam from the light source on a workpiece, a position-controlling table for mounting thereon the workpiece, a second optical system for focusing light reflected from the workpiece on a predetermined image surface, a photodetector having a light receiving surface arranged on the image surface, and a negative feedback amplifier for controlling the light source by the output of the photodetector.
REFERENCES:
patent: 3909131 (1975-09-01), Waters
patent: 4299491 (1981-11-01), Waters et al.
patent: 4325640 (1982-04-01), Dreyfus et al.
patent: 4326804 (1982-04-01), Mossey
patent: 4332477 (1982-06-01), Sato
Kelly, Brian O., "Lateral-Effect Photodiodes", Laser Focus, Mar. 1976.
Fujinami Minpei
Ido Satoshi
Kato Yasuo
Ozasa Susumu
Sakitani Yoshio
Hitachi , Ltd.
Nippon Telegraph & Telephone Public Corporation
Rosenberger R. A.
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