Chemistry of inorganic compounds – Zeolite – Structure defined x-ray diffraction pattern
Reexamination Certificate
2005-02-01
2005-02-01
Sample, David (Department: 1755)
Chemistry of inorganic compounds
Zeolite
Structure defined x-ray diffraction pattern
C423S706000, C423S708000, C423S713000, C502S060000, C208S046000
Reexamination Certificate
active
06849248
ABSTRACT:
A porous crystalline material (ITQ-21) which in its calcined form has the chemical compositionin-line-formulae description="In-line Formulae" end="lead"?X2O3:nYO2:mZO2in-line-formulae description="In-line Formulae" end="tail"?wherein (n+m) is at least 5, X is a trivalent element, Z is Ge, Y is at least one tetravalent element other than Ge, and the ratio is m/(n+m) is 0.0 to 0.5, and displays the X-ray diffraction values given in Table 1, and a method of preparation of the material in the presence of fluoride ions and using N(16)-methylsparteinium as structure director agent; the material being useful in its acid form and in bifunctional catalyst form in processes of catalytic cracking, hydro-cracking and alkylation of aromatics.
REFERENCES:
patent: 3411874 (1968-11-01), Ciric
patent: 5393511 (1995-02-01), Delprato et al.
patent: 6080382 (2000-06-01), Lee et al.
patent: 0 337 479 (1992-07-01), None
Cabañas María José Díaz
Canós Avelino Corma
García Fernando Rey
Consejo Superior de Investigaciones Cientificas
Klauber & Jackson
Sample David
Universidad Politecnica de Valencia
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