Polysilicon photoconductor for integrated circuits

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357 4, 357 59, 357 91, H01L 2714, H01L 2712, H01L 2904

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048210919

ABSTRACT:
A photoconductive element of polycrystalline silicon is provided with intrinsic response time which does not limit overall circuit response. An undoped polycrystalline silicon layer is deposited by LPCVD to a selected thickness on silicon dioxide. The deposited polycrystalline silicon is then annealed at a selected temperature and for a time effective to obtain crystal sizes effective to produce an enhanced current output. The annealed polycrystalline layer is subsequently exposed and damaged by ion implantation to a damage factor effective to obtain a fast photoconductive response.

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D. R. Bowman, R. W. Dutton, and R. B. Hammond, "New Integrated Polysilicon Photoconductor for Ultrafast Measurements on Silicon," IEDM Technical Digest, 117-120 (Dec. 1, 1985).
D. R. Bowman, R. B. Hammond, and R. W. Dutton, "Polycrystalline Silicon Integrated Photoconductors for Picosecond Pulsing and Gating," IEEE Electron Devices Letters, vol. EDL-6, No. 10, 502-504 (Oct. 1985).
W. R. Eisenstadt, R. B. Hammond, D. R. Bowman and R. W. Dutton, "Time-Domain Measurements for Silicon Integrated Circuit Testing Using Photoconductors," in Picosecond Electronics and Optoelectronics, G. A. Mourou, D. M. Bloom, and C.-H. Lee, Ed., Proc. of the Topical Meeting, Lake Tahoe, Nev., Mar. 13-15, 1985 (Springer-Verlag, New York), p. 66.
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