Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2008-04-15
2008-04-15
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S430000, C257SE21585
Reexamination Certificate
active
11307762
ABSTRACT:
Embodiments herein present a method for forming a poly filled substrate contact on a SOI structure. The method forms an insulator on a substrate and forms a substrate contact hole within the insulator. The insulator surface level is higher than final structure. Next, a poly overfill is performed, comprising filling the substrate contact hole with polysilicon and covering the insulator with the polysilicon. Specifically, the thickness of the polysilicon is greater than the size of the substrate contact hole. Following this, the polysilicon is etched, wherein a portion of the polysilicon is removed, and wherein the substrate contact hole is left partially filled with the polysilicon. Further, the etching of the polysilicon forms a concave recess within a top portion of the polysilicon. The etching of said polysilicon does not contact the substrate. The excess of insulator is polished off to the desired level.
REFERENCES:
patent: 5668036 (1997-09-01), Sune
patent: 6424043 (2002-07-01), Lane et al.
patent: 6593242 (2003-07-01), Morgenstern
patent: 6664585 (2003-12-01), Jin et al.
patent: 6696368 (2004-02-01), Derraa et al.
patent: 6708405 (2004-03-01), Hasler et al.
patent: 6734486 (2004-05-01), Okumura
patent: 6825545 (2004-11-01), Nasr
patent: 6838722 (2005-01-01), Bhalla et al.
patent: 6984568 (2006-01-01), Jin et al.
patent: 2001/0048125 (2001-12-01), Okumura
patent: 2002/0064600 (2002-05-01), Gebhart et al.
patent: 2003/0141525 (2003-07-01), Nowak
patent: 2005/0110079 (2005-05-01), Nowak
Dobuzinsky David M.
Kim Byeong Y.
Leobandung Effendi
Naeem Munir D.
Tessier Brian L.
Blecker, Esq. Ira D.
Gibb & Rahman, LLC
International Business Machines - Corporation
Isaac Stanetta
LandOfFree
Poly filled substrate contact on SOI structure does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Poly filled substrate contact on SOI structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Poly filled substrate contact on SOI structure will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3949146