Polishstop planarization method and structure

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437195, H01L 2144, H01L 21465

Patent

active

053565134

ABSTRACT:
The invention provides a method for producing a substantially planar surface overlying features of a semiconductor structure. The method comprises forming alternating layers of a hard polishing material and a soft polishing material over the features of the semiconductor structure, and then polishing the alternating layers to form a substantially planar surface over the features. The method takes advantage of the polish rates of the various materials used as alternating layers to enhance the planarization process.

REFERENCES:
patent: 3911562 (1975-10-01), Youmans
patent: 4523372 (1985-06-01), Balda et al.
patent: 4545852 (1985-10-01), Barton
patent: 4663832 (1987-05-01), Jambotkar
patent: 4671851 (1987-06-01), Beyer et al.
patent: 4744861 (1988-05-01), Matsunaga et al.
patent: 4775550 (1988-10-01), Chu et al.
patent: 4784721 (1988-11-01), Holmen et al.
patent: 4789648 (1988-12-01), Chow et al.
patent: 4836885 (1989-06-01), Breiten et al.
patent: 4843033 (1989-06-01), Plumton et al.
patent: 4843034 (1989-06-01), Herndon et al.
patent: 4874463 (1989-10-01), Koze et al.
patent: 4874464 (1989-10-01), Goodwin et al.
patent: 4879257 (1989-11-01), Patrick
patent: 4885261 (1989-12-01), Yoshikawa
patent: 4910155 (1990-03-01), Cote et al.
patent: 4940509 (1990-07-01), Tso et al.
patent: 4944836 (1990-07-01), Beyer et al.
patent: 4956313 (1990-09-01), Cote et al.
patent: 4962063 (1990-10-01), Maydan et al.
patent: 4964946 (1990-10-01), Gray et al.
patent: 4981550 (1991-01-01), Huttemann et al.
patent: 5064683 (1991-11-01), Poon et al.
patent: 5077234 (1991-12-01), Scoopo et al.
patent: 5084419 (1992-01-01), Sakao
patent: 5169491 (1992-12-01), Doan
"Planarization Process using Spin-On-Glass and Polishing", Research Disclosure-32635, Jun. 1991, p. 404.
W. E. Mutter, "Choice Stop Material for Chemical/Mechanical Polish Planarization", IBM Tech. Disc. Bull., vol. 27, No. 8, Jan. 1985, p. 4642.
K. D. Bayer et al., "Glass Planarization by Stop-Layer Polishing", IBM Tech. Disc. Bull., vol. 27, No. 8, Jan. 1985 p. 4700.
A. P. Ho et al., IBM Technical Disclosure Bulletin, vol. 24, No. 7A: 3389-3392 (Dec. 1981).
W. K. Chu et al., IBM Technical Disclosure Bulletin, vol. 24 No. 9: 4734-4735 (Feb. 1982).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Polishstop planarization method and structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Polishstop planarization method and structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Polishstop planarization method and structure will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2370009

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.