Polishing system and method with polishing pad pressure adjustme

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451 11, 451 57, 451170, 451274, 451287, B24B 4900

Patent

active

061394009

ABSTRACT:
Disclosed is a polishing system used for polishing a surface to be polished of an object to be polished by a polishing pad, which is capable of improving uniformity of the surface to be polished of the object to be polished by positively, accurately adjusting a polishing pressure, and a polishing method using the polishing system. Concretely, the surface to be polished of a wafer as the object to be polished is polished by relatively moving, along a plane, a polishing surface of the rotating polishing pad and the surface to be polished of the wafer in slide-contact with each other, and adjusting a pressing force applied from the polishing pad to the wafer in accordance with a polishing pressure previously set depending on a relative-positional relationship between the polishing surface of the polishing pad and the surface to be polished of the wafer.

REFERENCES:
patent: 5035087 (1991-07-01), Nishiguchi et al.
patent: 5317837 (1994-06-01), Stahli
patent: 5679060 (1997-10-01), Leonard et al.
patent: 5679212 (1997-10-01), Kato et al.
patent: 5816895 (1998-10-01), Honda
patent: 5944580 (1999-08-01), Kim et al.

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