Polishing method and polishing system

Abrading – Precision device or process - or with condition responsive... – With indicating

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C451S006000

Reexamination Certificate

active

11231755

ABSTRACT:
A polishing method includes supplying a slurry onto a pad disposed above a turntable while rotating the turntable, and polishing a workpiece disposed on the pad by pressing the workpiece to the pad, and detecting an ion concentration of a specific ion included in the slurry on the pad by using an ion test paper during the polishing.

REFERENCES:
patent: 5676590 (1997-10-01), Hiraoka
patent: 6028006 (2000-02-01), Bawa et al.
patent: 6043096 (2000-03-01), Evtodienko et al.
patent: 6071818 (2000-06-01), Chisholm et al.
patent: 2005/0226767 (2005-10-01), Klocke
patent: 04-232283 (1992-08-01), None
patent: 2000-225558 (2000-08-01), None
Fukushima, et al., “Method of Manufacturing Semiconductor Device”, U.S. Appl. No. 11/051,624, filed Jan. 27, 2005.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Polishing method and polishing system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Polishing method and polishing system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Polishing method and polishing system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3893280

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.