Abrading – Abrading process – Combined abrading
Reexamination Certificate
2005-05-31
2005-05-31
Nguyen, George (Department: 3723)
Abrading
Abrading process
Combined abrading
C451S041000, C451S398000, C451S286000, C438S645000, C438S633000
Reexamination Certificate
active
06899603
ABSTRACT:
In a polishing apparatus having a cover body with fluid pressing mechanism, during polishing, vibration and migration of sticking portion between a retainer and a membrane generated in downstream of rotation of a polishing platen is prevented by reducing sticking force between the retainer and the membrane to less than force needed to wafer polishing with rotation of the cover body.
REFERENCES:
patent: 4954142 (1990-09-01), Carr
patent: 5084071 (1992-01-01), Nenadic
patent: 5702977 (1997-12-01), Jang et al.
patent: 5744378 (1998-04-01), Homma
patent: 5770095 (1998-06-01), Sasaki
patent: 5851140 (1998-12-01), Barns
patent: 5913712 (1999-06-01), Molinar
patent: 5926732 (1999-07-01), Matsuura
patent: 6083083 (2000-07-01), Nishimura
patent: 6096632 (2000-08-01), Drynan
patent: 6099393 (2000-08-01), Katagiri et al.
patent: 6110024 (2000-08-01), Togawa
patent: 6110026 (2000-08-01), Arai
patent: 6165058 (2000-12-01), Zuniga
patent: 6203404 (2001-03-01), Joslyn et al.
patent: 6227955 (2001-05-01), Custer
patent: 6241593 (2001-06-01), Chen
patent: 6251215 (2001-06-01), Zuniga
patent: 6255151 (2001-07-01), Fukuda et al.
patent: 6261157 (2001-07-01), Bajaj et al.
patent: 6273803 (2001-08-01), Wang
patent: 6277008 (2001-08-01), Masuta
patent: 6283834 (2001-09-01), Liauzu
patent: 6326299 (2001-12-01), Homma et al.
patent: 6368955 (2002-04-01), Easter et al.
patent: 6380069 (2002-04-01), Chen et al.
patent: 6638854 (2003-10-01), Homma et al.
patent: 01193166 (1989-03-01), None
patent: 2278822 (1990-11-01), None
patent: 04310365 (1992-02-01), None
patent: 883780 (1996-03-01), None
patent: 08864562 (1996-03-01), None
patent: 10125880 (1998-05-01), None
patent: 11195628 (1999-07-01), None
Proceedings VLSI Multi Level Interconnect Conferrance 1991, A Four-Level-Metal Fully Planarized Interconnect Technology For Dence High Performance Logic And SRAM Applications 20-26.
Proceedings Semi Technology Symposium 1998, A New Slurry Free CMP Technique For Cu Interconnects 5-72 to 5-78.
Japanese Society For Precision Engineering, Autumn Conference 1991, confer nce paper publication, Trial Manufacture And Basic Characteristics Of Polishing Apparatus 211-212.
Hom-ma Yoshio
Kimura Takeshi
Kondo Seiichi
Nezu Hiroki
Sakuma Noriyuki
Antonelli Terry Stout & Kraus LLP
Nguyen George
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