Polarity dependent switch for resistive sense memory

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region

Reexamination Certificate

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C438S133000, C438S135000, C438S140000, C438S525000, C257S213000, C257S379000, C257SE21389, C257SE21703, C257SE29211, C365S148000, C365S185050

Reexamination Certificate

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07935619

ABSTRACT:
Methods of forming polarity dependent switches for resistive sense memory are described. Methods for forming a memory unit include implanting dopant material more heavily in a source contact than a bit contact of a semiconductor transistor, and electrically connecting a resistive sense memory cell to the bit contact. The resistive sense memory cell is configured to switch between a high resistance state and a low resistance state upon passing a current through the resistive sense memory cell.

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