Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate
2011-07-05
2011-07-05
Huynh, Andy (Department: 2829)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
C438S788000, C438S792000, C257SE21057, C427S569000, C427S571000
Reexamination Certificate
active
07972946
ABSTRACT:
Provided are a plasma treatment method and a plasma treatment device capable of forming a silicon nitride film having high compressive stress. In the plasma treatment method for depositing the silicon nitride film on a process target substrate by use of plasma of raw material gas containing silicon and hydrogen and of nitrogen gas, ion energy for disconnecting nitrogen-hydrogen bonding representing a state of bonding between the hydrogen in the raw material gas and the nitrogen gas is applied to the process target substrate so as to reduce an amount of nitrogen-hydrogen bonding contained in the silicon nitride film.
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Inoue Masahiko
Kawano Yuichi
Nishimori Toshihiko
Shimazu Tadashi
Brown Valerie
Huynh Andy
Mitsubishi Heavy Industries Ltd.
Westerman Hattori Daniels & Adrian LLP
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