Plasma treatment method and apparatus

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means

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118723E, 20429834, 31511121, H05H 100

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active

059001038

ABSTRACT:
A plasma treatment method comprising exhausting a process chamber so as to decompress the process chamber, mounting a wafer on a suscepter, supplying a process gas to the wafer through a shower electrode, applying high frequency power, which has a first frequency f.sub.1 lower than an inherent lower ion transit frequencies of the process gas, to the suscepter, and applying high frequency power, which has a second frequency f.sub.2 higher than an inherent upper ion transit frequencies of the process gas, whereby a plasma is generated in the process chamber and activated species influence the wafer.

REFERENCES:
patent: 4863549 (1989-09-01), Grunwald
patent: 5057185 (1991-10-01), Thomas, III et al.
patent: 5110438 (1992-05-01), Ohmi et al.
patent: 5116482 (1992-05-01), Setoyama et al.
patent: 5272417 (1993-12-01), Ohmi
patent: 5330606 (1994-07-01), Kubota et al.
patent: 5332880 (1994-07-01), Kubota et al.
Journal of Vaccum Science and Technology: Part A, vol. 4, No. 3, pp. 729-738, May/June 1986, D.L. Flamm, "Frequency Effects in Plasma Etching".

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