Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2008-01-22
2008-01-22
Vinh, Lan (Department: 1765)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C438S706000, C438S710000, C156S345420
Reexamination Certificate
active
07320941
ABSTRACT:
There is disclosed a plasma technique in which a plasma generation technique frequently used in various fields including a semiconductor manufacturing process is used, and generation of plasma instability (high-speed impedance change of a plasma) can efficiently be suppressed and controlled in order to manufacture stable products. In a method of disposing an object in a chamber and generating the plasma to treat the object, the chamber is sealed by a surrounding member so as to have an inner space, at least a part of the member includes a dielectric material, an RF induction coil is disposed outside the dielectric member, and a direct-current electric field is supplied into the inner space by a method of passing a direct current through the RF induction coil or another method, so that the plasma is stabilized.
REFERENCES:
patent: 4500408 (1985-02-01), Boys et al.
patent: 5785807 (1998-07-01), Kanai et al.
patent: 6083363 (2000-07-01), Ashtiani et al.
patent: 6197165 (2001-03-01), Drewery et al.
patent: 6375810 (2002-04-01), Hong
patent: 6494998 (2002-12-01), Brcka
patent: 6551447 (2003-04-01), Savas et al.
patent: 6875366 (2005-04-01), Sumiya et al.
patent: 2001/0017109 (2001-08-01), Liu et al.
Nakajima Shu
Nishida Takumasa
Lam Research Corporation
Martine & Penilla & Gencarella LLP
Vinh Lan
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