Plasma spectrometer with shutter assembly

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

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Details

359507, 359509, G01N 2163

Patent

active

059460890

ABSTRACT:
Apparatus for optical analysis of a sample, including an energy source, which generates a pulse of energy that is incident on the sample, causing the sample to emit radiation characteristic of the composition of the sample, and a detector assembly, which receives and analyzes the radiation emitted by the excited sample. An optical assembly conveys the emitted radiation from the sample to the detector assembly, the optical assembly including an optic proximal to the sample, on which optic the radiation is incident along a beam path thereof between the sample and the detector assembly. A moving mechanical element moves in synchronization with the pulse from the energy source so as to substantially prevent matter ejected from the sample responsive to the incident energy from accumulating on the optic.

REFERENCES:
patent: 3571554 (1971-03-01), Baujoin
patent: 4191475 (1980-03-01), Sourrouille
patent: 4925307 (1990-05-01), Cremers et al.
patent: 4986658 (1991-01-01), Kim
patent: 5312397 (1994-05-01), Cosmescu
patent: 5379103 (1995-01-01), Zigler

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