Plasma sculpturing with a non-planar sacrificial layer

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156646, 156657, 156668, 204192E, 252 791, 427 38, B44C 122, C03C 1500, C03C 2506, B29C 1708

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active

045156522

ABSTRACT:
A method of plasma planarization of the surface topography of a substrate layer is provided wherein a sacrificial layer, having an etch rate substantially different from the etch rate of the substrate layer, is applied to the surface topography of that substrate layer. The sacrificial and substrate layers are then plasma etched to remove the sacrificial layer and portions of the substrate layer. The ratio of substrate layer to sacrificial layer etch rate can be controlled by the specific material and etchant used to compensate for non-planar surface features of the sacrificial layer such that the resulting substrate surface topography is planar.

REFERENCES:
patent: 3718514 (1973-02-01), Erdman et al.
patent: 4025411 (1977-05-01), Hom-Ma et al.
patent: 4293588 (1981-10-01), Neukomm
patent: 4377438 (1983-03-01), Moriya et al.
"Plasma Planarization"; A. C. Adams; Solid State Technology; Apr., 1981; pp. 178-181.
"A 6K-Gate CMOS Gate Array"; Terio Kobayashi et al.; IEEE International Solid-State Circuits Conference; Feb. 11, 1982, pp. 174-175.
"Planarization Properties of Resist and Polyimide Coatings"; Journal of the Electrochemical Society; Jul., 1983, pp. 1543-1548, White.
"Planarization of Phosphosilicate Glass Films"; L. F. Johnson et al.; J. Vac. Sci. Technol. B; (2); Apr.-Jun. 1983; pp. 487-489.
"LSI Surface Leveling by RF Sputter Etching"; Yoshio Hom-Ma et al., J. Electrochem. Soc.; Sep. 1979; pp. 1531-1533.
J. Electrochem. Soc. Solid-State Science and Technology, vol. 128, No. 2, Feb. 1981, Planarization of Phosphorus-Doped Silicon Dioxide, A. C. Adams et al., pp. 423-429.

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