Plasma processing method and post-processing method

Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...

Reexamination Certificate

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Reexamination Certificate

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07871532

ABSTRACT:
A plasma processing method for performing a plasma process on a target object placed in a chamber includes a first plasma process of turning a gas containing at least a halogen element into plasma to generate first plasma, thereby processing the target object; a second plasma process, subsequent to the first plasma process, of supplying a gas containing oxygen into the chamber to generate second plasma, thereby processing the chamber and the target object; and a third plasma process, subsequent to the second plasma process, of turning a gas containing at least fluorine into plasma to generate third plasma, thereby processing the target object.

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patent: 2003/0129106 (2003-07-01), Sorensen et al.
patent: 2004/0043612 (2004-03-01), Jung
patent: 62-005532 (1987-01-01), None
patent: WO/99/52126 (1999-10-01), None

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