Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Reexamination Certificate
2008-07-01
2008-07-01
Norton, Nadine (Department: 1792)
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
C216S079000, C216S069000, C216S071000, C438S725000, C438S689000
Reexamination Certificate
active
07393460
ABSTRACT:
The plasma processing method comprises the step of removing an organic material film forming an upper layer relative to a patterned SiOCH series film by the processing with a plasma of a process gas containing an O2gas, wherein the plasma has an O2+ion density not lower than 1×1011cm−3and an oxygen radical density not higher than 1×1014cm−3.
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Hori Masaru
Kubota Kazuhiro
George Patricia A
Norton Nadine
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tokyo Electron Limited
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