Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Reexamination Certificate
2003-08-28
2008-12-16
Olsen, Allan (Department: 1792)
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
Reexamination Certificate
active
07465407
ABSTRACT:
In a plasma processing method for supplying an electric power to a first electrode, making a first electrode have a ground potential, or making a first electrode have a floating potential while supplying gas to a plasma source arranged in a vicinity of an object to be processed at a pressure in a vicinity of an atmospheric pressure. The method includes processing a part of the object to be processed with a plasma in a state where an area of a surface of a potentially controlled second electrode, arranged in a position opposite to the plasma source via the object to be processed, is made superposed on the object to be processed smaller than an area of a surface of the plasma source superposed on the object to be processed.
REFERENCES:
patent: 5102523 (1992-04-01), Beisswenger et al.
patent: 5315473 (1994-05-01), Collins et al.
patent: 5400209 (1995-03-01), Moslehi
patent: 6248219 (2001-06-01), Wellerdieck et al.
patent: 6497839 (2002-12-01), Hasegawa et al.
patent: 2003/0091742 (2003-05-01), Forget et al.
patent: 2003/0170472 (2003-09-01), Fukuda et al.
patent: 7-86238 (1995-03-01), None
patent: 2001-102199 (2001-04-01), None
patent: 2003-59841 (2003-02-01), None
patent: 2003-59909 (2003-02-01), None
Nakayama Ichiro
Okumura Tomohiro
Saitoh Mitsuo
Olsen Allan
Panasonic Corporation
Wenderoth , Lind & Ponack, L.L.P.
LandOfFree
Plasma processing method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Plasma processing method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Plasma processing method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4020762