Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Patent
1994-09-19
1997-07-15
Tung, T.
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
156431, 156461, 216 79, H01L 213065
Patent
active
056480008
ABSTRACT:
Ashing processing is performed using an atmosphere pressure discharge apparatus for stably producing discharge at an atmosphere pressure. Dielectric substance is arranged in a space between a pair of electrodes. A rare gas is flowed into the space. An electric field is generated in the space, thereby to produce plasma. A gas for providing oxygen to a rare gas is used as a reactive gas. The concentration of the reactive gas is 3% or less, in particular, 1% or less. Therefore, A resist film or the like formed on a substrate is removed (peeled).
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Hayashi Shigenori
Yamazaki Shunpei
Blanche Bradley D.
Ferguson Jr. Gerald J.
Semiconductor Energy Laboratory Co,. Ltd.
Tung T.
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