Chemistry: electrical and wave energy – Apparatus – Coating – forming or etching by sputtering
Patent
1988-11-23
1990-01-02
Weisstuch, Aaron
Chemistry: electrical and wave energy
Apparatus
Coating, forming or etching by sputtering
156345, 156643, 118723, 20419232, H01H 146
Patent
active
048911186
ABSTRACT:
In a typical plasma processing apparatus, microwaves are generated into a processing chamber which contains a gas and a substrate. Magnetic fields transmitted into the processing chamber cause plasma to be produced when microwaves are generated. Typically an RF bias voltage is applied to the substrate during the process. By optimizing the RF bias voltage which the pulses of microwaves the apparatus produces a higher quality thin film, or etching process, without damaging the substrate surface.
REFERENCES:
patent: 4316791 (1982-02-01), Taillet
patent: 4581100 (1986-04-01), Hatzakis et al.
patent: 4705595 (1987-11-01), Okudaira et al.
patent: 4776918 (1988-10-01), Otsubo et al.
patent: 4795529 (1989-01-01), Kawasaki et al.
patent: 4808258 (1989-02-01), Otsubo et al.
Doki Masahiko
Ooiwa Kiyoshi
Fuji Electric & Co., Ltd.
Weisstuch Aaron
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