Plasma etching process

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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Details

156646, 156651, 156657, 1566591, 156662, 20419237, 252 791, 437233, H01L 21306, B44C 122, C03C 1500, C03C 2506

Patent

active

048865699

ABSTRACT:
A polysilicon layer or a single crystal silicon substrate is plasma etched in a two staged process. The first stage was a non-selective anisotropic etch to define a desired pattern by etching part way through the polysilicon. The second stage was a selective etch to secure remaining polysilicon and expose the substrate.

REFERENCES:
patent: 4457820 (1984-07-01), Bergeron et al.
patent: 4528066 (1985-07-01), Merkling et al.

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