Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Reexamination Certificate
2006-02-22
2008-08-12
Ahmed, Shamim (Department: 1792)
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
C216S058000, C438S706000, C438S710000
Reexamination Certificate
active
07410593
ABSTRACT:
Methods are described which comprise: providing a plasma etching apparatus having an etching chamber; disposing a substrate to be etched in the chamber; introducing N2gas and one or more process gases into the chamber; and etching the substrate, wherein the introduction of the N2gas is stopped prior to etching, and wherein etching comprises an initial plasma ignition wherein at least a portion of the N2gas remains present in the chamber during initial plasma ignition. Additional methods are described which comprise: providing a plasma etching apparatus having an etching chamber; disposing a substrate to be etched in the chamber; introducing N2gas and one or more process gases into the chamber; applying power to an electrode in the chamber such that an N2memory species is formed; and etching the substrate, where the introduction of the N2gas into the chamber can be stopped prior to etching. Other methods are also described which comprise: providing a plasma etching apparatus having an etching chamber; disposing a substrate to be etched in the chamber; introducing N2gas into the chamber; applying power to an electrode in the chamber such that an N2memory species is formed; removing the applied power from the electrode in the chamber; stopping the introduction of the N2gas into the chamber and introducing one or more process gases into the chamber; and etching the substrate.
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Hong Shih-Ping
Lee Hong-Ji
Wei An-Chyi
Ahmed Shamim
Jianq Chyun IP Office
MACRONIX International Co. Ltd.
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