Plasma etching apparatus

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – Having glow discharge electrode gas energizing means

Reexamination Certificate

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Reexamination Certificate

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06849154

ABSTRACT:
A plasma etching apparatus includes an upper electrode and a lower electrode (susceptor) on which a semiconductor wafer is disposed, the upper and lower electrodes being arranged within a process chamber, a first high frequency power source for applying a first high frequency power to the upper electrode, a second high frequency power source for applying a second high frequency power having a frequency lower than the frequency of the first high frequency power to the lower electrode. A third high frequency power source for superposing a third high frequency power having a frequency lower than that of the first high frequency power and higher than that of the second high frequency power on the first high frequency power. A phase controller for adjusting the phase difference between the second high frequency power and the third high frequency power.

REFERENCES:
patent: 4539068 (1985-09-01), Takagi et al.
patent: 4579618 (1986-04-01), Celestino et al.
patent: 5314603 (1994-05-01), Sugiyama et al.
patent: 5500256 (1996-03-01), Watabe
patent: 5716534 (1998-02-01), Tsuchiya et al.
patent: 6089181 (2000-07-01), Suemasa et al.
patent: 7-302786 (1995-11-01), None
patent: 8-31596 (1996-02-01), None
patent: 8-31807 (1996-02-01), None
patent: 08264515 (1996-10-01), None
patent: 10041281 (1998-02-01), None
Translation of International Preliminary Examination Report.

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