Plasma etch process for multilayer vias having an organic...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C257SE21218, C257SE21577, C257SE21313, C257SE21600, C257SE21024

Reexamination Certificate

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07125796

ABSTRACT:
A process is provided for fabricating a via52between bonded wafers without undercutting an organic bonding material32. The process for forming the via52in a structure including a dielectric material14and an organic bonding material32, comprises forming a resist material42on the dielectric layer14and etching through the dielectric layer14and the organic bonding material32with 60CF4/20Ar/60CHF3/20N2. The resist may then be removed with an anisotropic high density oxygen plasma.

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Schier, Michael, “Reactive Ion Etching of Benzocyclobutene Using a Silicon Nitride Dielectric Etch Mask,” J. Electrochemical Society, vol. 142, No. 9, Sep. 1995, pp. 3238-3240.

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