Etching a substrate: processes – Gas phase etching of substrate – Application of energy to the gaseous etchant or to the...
Patent
1992-10-09
1995-11-21
Dang, Thi
Etching a substrate: processes
Gas phase etching of substrate
Application of energy to the gaseous etchant or to the...
216 79, H01L 2100
Patent
active
054683394
ABSTRACT:
An improved SiO.sub.x etch which employs CHF.sub.3, N.sub.2 and a light mass cooling gas in total pressure on the order of 3000 mT in a confined plasma reactor. High aspect ratios at least 10:1 are obtainable.
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Chen Susan H.
Gupta Subhash
Advanced Micro Devices , Inc.
Dang Thi
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