Plasma CVD method

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S348000

Reexamination Certificate

active

07452829

ABSTRACT:
In a process of forming a silicon oxide film116that constitutes an interlayer insulating film with TEOS as a raw material through the plasma CVD method, the RF output is oscillated at 50 W, and the RF output is gradually increased from 50 W to 250 W (an output value at the time of forming a film) after discharging (after the generation of O2-plasma). A TEOS gas is supplied to start the film formation simultaneously when the RF output becomes 250 W, or while the timing is shifted. As a result, because the RF power supply is oscillated at a low output when starting discharging, a voltage between the RF electrodes can be prevented from changing transitionally and largely.

REFERENCES:
patent: 4917044 (1990-04-01), Yau
patent: 5243202 (1993-09-01), Mori
patent: 5403772 (1995-04-01), Zhang
patent: 5472825 (1995-12-01), Sayka
patent: 5571578 (1996-11-01), Kaji
patent: 6015762 (2000-01-01), Yamazaki
patent: 6103992 (2000-08-01), Noddin
patent: 6183816 (2001-02-01), Yamazaki
patent: 04-123424 (1992-04-01), None
patent: 06-084888 (1994-03-01), None
patent: 06-318552 (1994-11-01), None
Z. Jian-ming, “Optimization of Glow Discharge Deposition of Amorphous Silicon Solar Cells”, 1988, 20th IEEE Photovoltaic Specialists Conference, vol. 1, pp. 296-300.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Plasma CVD method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Plasma CVD method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Plasma CVD method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4029307

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.