Plasma CVD apparatus and processes

Etching a substrate: processes – Etching and coating occur in the same processing chamber

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118715, 118724, 118733, 118723MB, 156345, 216 67, 216 79, H01L 2100

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054436869

ABSTRACT:
Processes for producing and using a novel CVD apparatus for depositing silicon layers onto suitable substrates and for the in-situ etching removal of background silicon deposits from the interior walls of the apparatus. The invention comprises using an apparatus having a fused quartz reaction chamber and precoating the interior wall of the reaction chamber with a thin continuous barrier layer of Al.sub.2 O.sub.3 which is inert to the etching gas introduced for the removal of the background silicon deposits.

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