Planarization method and technique for isolating semiconductor i

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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29576W, 29580, 156646, 156649, 156651, 156653, 156657, 1566611, 156668, B44C 122, C03C 1500, C03C 2506, B29C 1708

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046629866

ABSTRACT:
A technique for producing planarized semiconductor surfaces and for isolating semiconductor islands.

REFERENCES:
patent: 4307179 (1981-12-01), Chang et al.
patent: 4389281 (1983-06-01), Anantha et al.
patent: 4470874 (1984-09-01), Bartush et al.
patent: 4505025 (1985-03-01), Kurosawa et al.
Bartush et al., Dielectric Isolation Planarization, IBM Technical Disclosure Bulletin, vol. 21, No. 5, Oct. 1978, pp. 1868-1869.
Kinney et al., Method for Producing Single Crystal Silicon on an Insulating Substrate, IBM Tech. Discl. Bulletin, vol. 24, No. 6, Nov. 1981, pp. 2955-2957.
Tsang, Forming Wide Trench Dielectric Isolation, IBM Tech. Discl. Bulletin, vol. 25, No. 11B, Apr. 1983, pp. 6129-6130.
Eiden et al., "Geometry Independent Deep Trench Etching, Refill and Planarization for Isolation of Merged Bipolar-CMOS Devices", Extended Abstracts, vol. 84-2, The Electrochemical Society, Incorporated, Fall Meeting, Oct. 7-12, 1984, Abstract No. 398, pp. 570-571.

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