Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2007-06-07
2010-11-23
Walke, Amanda C. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S007000, C430S311000, C430S303000, C428S690000
Reexamination Certificate
active
07838195
ABSTRACT:
There is provided an essentially planar test substrate for non-contact printing. The substrate has a first layer having a first surface energy and having a planar measurement portion. A liquid containment pattern is over at least the measurement portion of the first layer. The liquid containment pattern has a second surface energy that is different from the first surface energy. The measurement portion of the first layer and the liquid containment pattern together are substantially planar.
REFERENCES:
patent: 4003312 (1977-01-01), Gunther
patent: 4430403 (1984-02-01), Westdale et al.
patent: 6228559 (2001-05-01), Oda
patent: 6231988 (2001-05-01), Kato et al.
patent: 6416932 (2002-07-01), Ray et al.
patent: 7190113 (2007-03-01), Aoki
patent: 2004/0075384 (2004-04-01), Aoki
patent: 2004/0155578 (2004-08-01), Ito et al.
patent: 39 11 934 (1990-10-01), None
patent: 0 401 439 (1990-12-01), None
patent: 932081 (1999-07-01), None
patent: 1246011 (2002-10-01), None
patent: 62-271741 (1987-11-01), None
patent: WO 97/07986 (1997-03-01), None
patent: WO 99/50069 (1999-10-01), None
CRC Handbook of Chemistry and Physics, 81stEdition, 2000-2001 (Book Not Supplied).
PCT International Search Report and Written Opinion for International Application No. PCT/US2007/013583 dated Feb. 27, 2008.
Coe Nigel Morton
Lang Charles D.
Sorich Stephen
Tadepalli Nageswara Rao
E. I. du Pont de Nemours and Company
Lamming John H.
Walke Amanda C.
LandOfFree
Planar test substrate for non-contact printing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Planar test substrate for non-contact printing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Planar test substrate for non-contact printing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4181726