Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Recessed oxide by localized oxidation
Reexamination Certificate
2011-04-26
2011-04-26
Landau, Matthew C (Department: 2813)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Recessed oxide by localized oxidation
C438S022000, C438S042000, C438S046000, C438S048000, C257S022000, C257S506000, C257S773000, C257SE21286
Reexamination Certificate
active
07932160
ABSTRACT:
The invention relates to a method of producing a semiconductor device, comprising the following steps consisting in: forming first, second and third semiconductor layers (1, 2, 3), whereby the first and second layers (1, 3) contain a smaller concentration of oxidizable species than the second layer (2); forming a mask (4) on the third layer (3); and oxidizing the second layer (2) with the diffusion of oxidizing species through the third layer (3).
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Almuneau Guilhem
Bardinal-Delagnes Véronique
Camps Thierry
Fontaine Chantal
Munoz-Yague Antonio
Centre National de la Recherche Scientifique "CNRS"
Foley & Lardner LLP
Landau Matthew C
Snow Colleen E
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