Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-06-21
2011-06-21
Warren, Matthew E (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S019000, C257S288000, C257S368000, C257S395000, C257S396000, C257S397000, C257S622000, C257SE21549, C257SE29255, C257SE29277, C257SE29279, C257SE29020, C257SE29023, C257SE29021, C438S221000, C438S222000, C438S300000
Reexamination Certificate
active
07964910
ABSTRACT:
Disclosed is a transistor that incorporates epitaxially deposited source/drain semiconductor films and a method for forming the transistor. A crystallographic etch is used to form recesses between a channel region and trench isolation regions in a silicon substrate. Each recess has a first side, having a first profile, adjacent to the channel region and a second side, having a second profile, adjacent to a trench isolation region. The crystallographic etch ensures that the second profile is angled so that all of the exposed recess surfaces comprise silicon. Thus, the recesses can be filled by epitaxial deposition without divot formation. Additional process steps can be used to ensure that the first side of the recess is formed with a different profile that enhances the desired stress in the channel region.
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Chen David Z
Gibb I. P. Law Firm, LLC
International Business Machines - Corporation
Petrokaitis, Esq. Joseph
Warren Matthew E
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