Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1995-06-07
1997-11-04
Brown, Peter Toby
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257329, 257335, 257337, 257341, 257343, H01L 2978, H01L 2702
Patent
active
056843054
ABSTRACT:
An isolated pilot transistor 100 for a QVDMOS device 10 has a gate and drain region in symmetry with the sources 20 of device 10 and an additional resistance 116 in the drain 118 to compensate for current spreading between the source 120 and the buried layer resistor 132.
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patent: 5387875 (1995-02-01), Tateno
patent: 5442216 (1995-08-01), Gough
Weyers et al., A 50 V Smart Power Process with Dielectric Isolation by 51 MOX, IEDM 92-225-228, IEEE.
European Search Report mailed Sep. 12, 1996.for EP 96 40 0695.
PCT Communication mailed Oct. 15, 1996 for PCT/US96/08826.
A. Watson Swager, "Power ICs Weighing The Benefits Of Integration", EDN-Electrical Design News, vol. 39, No. 14, Newton, MA, Jul. 1994, pp. 68-72, 74, 76, 78, 80, 82.
Brown Peter Toby
Harris Corporation
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